"Spectral-resolved photoluminescence application for quantifying plasmonic light trapping" and "The Influence of Crystal Orientation on Surface Passivation in Multi-Crystalline Silicon"
Chog Barugkin and Kelvin Sio (Centre for Sustainable Energy Systems)
SOLAR SEMINAR SERIESDATE: 2013-06-12
TIME: 16:00:00 - 17:00:00
LOCATION: Ian Ross Seminar Room
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ABSTRACT:
Chog Barugkin
Title "Spectral-resolved photoluminescence application for quantifying plasmonic light trapping"
Abstract: During this talk, we are going to present a new method of using spectral-resolved photoluminescence measurements to quantify the light trapping for a range of plasmonic structures. Unlike conventional absorption measurement, free carrier and parasitic absorption can be excluded by using this technique. By combining Ag nanoparticles as a scattering structure and diffuse white paint as a back surface reflector (BSR) on silicon wafers, we can achieve absorption enhancement which is comparable with literature values for inverted pyramids. We also investigate the application of plasmonics on the back of a silicon wafer with a structure that mimics the rear of a high efficiency solar cell. Photoluminescence spectra are measured on samples with and without plasmonic particles to extract the absorptivity. Based on the extracted absorption, a modelled external quantum efficiency and short circuit current density of the cell structures are obtained.
Kelvin Sio
Title: The Influence of Crystal Orientation on Surface Passivation in Multi-Crystalline Silicon
Abstract: We present an approach to study the variation of the surface recombination velocity in multi-crystalline silicon wafers through photoluminescence imaging for thin, passivated and mirror polished wafers. The influence of crystal orientation on surface passivation is investigated for various passivating films, including silicon nitride and aluminum oxide. Our results show that the influence of surface orientation is negligible in well passivated multi-crystalline silicon wafers due to the detrimental effects of crystal defects. Our study on hydrogenated samples suggests that aluminum oxide passivation exhibits a similar surface dependence as native oxide passivation. A slight and different surface dependence is observed in one of the silicon nitride films used in the study.
BIO:
Chog Barugkin is currently a Ph.D. student in the Research School of Engineering, Australian National University, Australia. He earned his B.S. in chemistry from Beijing Normal University, Beijing, China, in 2010. His research interests primarily focus on applying and characterizing plasmonic light trapping structures on silicon solar cells.
Hang Sio received his B.E. degree from The Australian National University in 2011. Since then, he started his PhD degree in engineering at the The Australian National University. His research interest focuses on the recombination activities of crystal defects in multi-crystalline silicon material.
